When Electronics Fail Quietly: How Reliability Engineering Protects Spacecraft, EVs and Critical Infrastructure
- Srihari Maddula
- Nov 12
- 4 min read
Updated: Nov 14
In consumer electronics, a component failure means an irritated user.In aerospace, defense, EV powertrains, or medical systems, a single fault can trigger mission aborts, safety hazards, or multi-crore recalls.
The deeper truth?
Electronics rarely die suddenly — they degrade silently.They pass factory tests, but fail in the field when stakes are highest.
And that’s where semiconductor reliability engineering transforms products into trusted systems.
Thanks to open-source tools, public reliability databases, and AI-powered simulation frameworks, even small engineering teams can design with NASA-grade precision from silicon to PCB to long-term field operation.
Failure Doesn’t Start on the Launchpad — It Starts in the Datasheet
Most field failures aren’t caused by “bad hardware.” They’re caused by bad assumptions.
Typical failure triggers:
Reliability starts in component derating and environmental modeling, not rework after a failure.
Engineers now rely on public aerospace reliability databases:
NASA Lessons Learned Database Failures from real missions: solar array wiring, COTS parts in space, connector degradation, radiation-induced anomalies.
NASA NEPP Radiation data, derating rules, PCB material aging, moisture failures, conformal coating guides.
MIL-HDBK-217 / MIL-HDBK-338 Failure-rate models, MTBF predictions, mission profile reliability.
ESA Space Components Tin whisker mitigation, solder joint fatigue, polymer degradation, bond-wire lift data.
These are not academic papers — they are post-mortems from real spacecraft, satellites, rovers and defense platforms. And they are free.
Reliability Is Not Guesswork — It Is Math, Modeling and Stress Prediction
Modern teams treat reliability like data science — measurable, predictable, and improvable.
They use:
MTBF calculators (MIL-217, Telcordia)
Weibull modeling for lifetime distribution
Reliability block diagrams for redundant systems
Thermal and electrical stress simulation
Open tools make this accessible:
OpenFOAM – CFD airflow simulation for EV chargers and power modules
SimScale – Cloud-based thermal and airflow analysis
FEMM – Magnetic and thermal correlation for motors and transformers
LTspice / PARTSIM – Power-stage stress and thermal runaway checks
Weibull spreadsheets – Component wear-out forecasting
This data-driven approach turns embedded systems development into a proactive reliability discipline — predicting failures before they exist.
That’s how EV inverters, drone ESCs, and satellite power controllers now last for years, not months.
Field Failures Are Often Born in Manufacturing
Even the best schematic can be undone by a solder joint or BGA defect.
Common root causes:
Cold solder joints and under-reflowed QFNs
Cracked vias and trapped moisture
Flux residue leakage and whisker growth
BGA opens due to reflow stress
Open tools for early detection:
sigrok + PulseView – Detect transient power and converter faults
OpenBoardView – Visualize PCB pad-level trace failures
OpenHTF – Automate board tests (UART, I²C, JTAG)
UrJTAG – Boundary-scan diagnostics for BGA integrity
PyVISA + SCPI – Automate thermal and soak tests
These are critical for Industrial IoT and automation hardware and high-reliability IoT product engineering.
Heat: The Silent Killer of Electronics
Every 10°C rise in temperature halves component lifespan.Thermal degradation silently weakens solder joints, electrolytics, and copper interfaces.
Open simulation tools now make heat modeling practical:
OpenFOAM / SimScale – Analyze airflow and enclosure convection
PowerEsim Thermal – Predict hotspot zones in high-power stages
FreeCAD + KiCad StepUp – Create thermal 3D board models
Engineers use these to design EV chargers, power modules, and data-center PSUs that run for 10 years instead of one — a cornerstone of Smart infrastructure solutions.

Radiation, ESD, and Transients: The Invisible Killers
High-energy transients are the most unpredictable threat to embedded electronics — especially in space, defense, and EV environments.
Failure triggers include:
ESD discharges and latch-up events
Lightning surges and switching transients
Cosmic ray bit-flips and single-event latch-ups
Open references help harden designs:
JEDEC ESD/Latch-up standards
TI / ADI protection design guides
NASA SEE/SEL radiation test data
Open EMFI / glitch repositories
In AI-powered embedded systems and mission-critical devices, fault containment is as vital as performance — ensuring that a single transient doesn’t cascade into full system failure.
When Products Fail in the Field — Learn, Don’t Panic
Even after extensive validation, real-world aging causes unexpected issues:
Connector oxidation
Flash data retention loss
Thermal pad degradation
Moisture ingress
Open forensic tools empower root-cause analysis:
Binwalk – Extract and inspect corrupted firmware
OpenScanLab – X-ray datasets for BGA void inspection
Ghidra – Reverse-engineer firmware crashes and corruption
FRACAS templates – Structured RCA and corrective action systems
A truly reliable product evolves with every lesson learned — turning failure into knowledge.
Reliability Is Good Business
For industries like:
EV chargers and battery systems
Grid-scale inverters
Industrial automation controllers
Medical devices and wearables
Satellites and defense electronics
Reliability isn’t optional — it’s profit protection.
Every failure avoided saves:
Truck-roll and service costs
Warranty replacements
Customer trust erosion
Regulatory exposure
A reliable product builds:
Premium brand reputation
Recurring service contracts
Global export credibility
Sustainable infrastructure impact
Reliability isn’t an expense: it’s a competitive differentiator in the AI product engineering era.
Final Thoughts: Reliability Is Now Accessible
Ten years ago, reliability engineering required million-dollar EDA licenses.Today, open tools and public databases make mission-grade design achievable for small teams and startups.
OpenFOAM for thermal airflow
LTspice for power stress simulation
sigrok/PulseView for live debugging
Weibull tools for life prediction
NASA NEPP for derating analysis
OpenHTF for automated production testing
OpenBoardView for PCB trace diagnostics
This is how modern embedded engineering delivers smart, durable, and data-driven systems.
EurthTech: Engineering Electronics That Last
At EurthTech, we specialize in helping teams design 10-year life-cycle electronics, not disposable hardware.
Our reliability services include:
Thermal modeling and CFD simulation
Component derating and lifetime audits
PCB reliability and vibration testing
Boundary-scan and automated test integration
Root-cause analysis and field data analytics
Long-life component sourcing and qualification
We combine Embedded systems development, IoT & embedded services in India, and AI for smart infrastructure to help clients build robust, high-reliability systems for aerospace, defense, EVs, and industrial automation.
Because reliable systems don’t happen by chance —they happen by engineering. Need expert guidance for your next engineering challenge?
Connect with us today — we offer a complimentary first consultation to help you move forward with clarity.











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